Advances in Melanoma Risk Assessment and Metastatic Disease Monitoring

A stellar presentation on developing tools to better stratify risk factors for melanoma and identifying novel biomarkers to allow for melanoma treatment efficacy monitoring and progress.

Presenter: Dr. David Polsky, Professor of Dermatology and Pathology, Alfred W. Kopf, MD Professor of Dermatologic Oncology in the Department of Dermatology at NYU Langone Medical Center

Thank you to Genentech for their support and exhibition at this event.